RRAM Random Number Generator Based on Train of Pulses

In this paper, the modulation of conductance levels resistive random access memory (RRAM) devices is used for generation numbers by applying a train RESET pulses. The influence pulse amplitude and width on device resistance also analyzed. For each characteristic, number pulses required to drive particular threshold variable, it exploited extract numbers. Based behavior, generator (RNG) circuit proposed. To assess performance circuit, National Institute Standards Technology (NIST) randomness tests are applied evaluate bitstreams obtained. experimental results show that four bits simultaneously obtained, passing all without need post-processing. presented method provides new strategy generate based RRAMs hardware security applications.